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Detection of Graphene Cracks By Electromagnetic Induction, Insensitive to Doping Level

Yoon, Taeshik; Kang, Sumin; Kang, Tae Yeob; Kim, Taek-Soo, CMES-COMPUTER MODELING IN ENGINEERING & SCIENCES, v.120, no.2, pp.351 - 361, 2019-08

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