Showing results 1 to 16 of 16
Absolute distance measurement with extension of nonambiguity range using the frequency comb of a femtosecond laser Jang, Yoon-Soo; Lee, Keunwoo; Han, Seongheum; Lee, Joohyung; KIM, Young-Jin; Kim, Seung-Woo, OPTICAL ENGINEERING, v.53, no.12, 2014-12 |
Absolute Distance Meter Operating on a Free-Running Mode-Locked Laser for Space Mission Jang, Yoon-Soo; Kim, Wooram; Jang, Heesuk; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.19, no.7, pp.975 - 981, 2018-07 |
Absolute length measurement with the frequency comb of a femtosecond laser Hyun, Sang-Won; KIM, Young-Jin; Kim, Yun-Seok; Jin, Jong-Han; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.9, 2009-09 |
Active compensation of large dispersion of femtosecond pulses for precision laser ranging Lee, Sang-Hyun; Lee, Joo-Hyung; KIM, Young-Jin; Lee, Keun-Woo; Kim, Seung-Woo, OPTICS EXPRESS, v.19, no.5, pp.4002 - 4008, 2011-02 |
Astigmatism-corrected endoscopic imaging probe for optical coherence tomography using soft lithography Lee, Min Woo; Kim, Yeon Hoon; Xing, Jingchao; Yoo, Hongki, OPTICS LETTERS, v.45, no.17, pp.4867 - 4870, 2020-09 |
Broadband Modulation of Terahertz Waves With Non-Resonant Graphene Meta-Devices Lee, Seung Hoon; Kim, Hyeon-Don; Choi, Hyun Joo; Kang, Byungsoo; Cho, Yong Rae; Min, Bumki, IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, v.3, no.6, pp.764 - 771, 2013-11 |
Comb-referenced laser distance interferometer for industrial nanotechnology Jang, Yoon-Soo; Wang, Guochao; Hyun, Sang-Won; Kang, Hyun Jay; Chun, Byung Jae; KIM, Young-Jin; Kim, Seung-Woo, SCIENTIFIC REPORTS, v.6, 2016-08 |
Graphene-ferroelectric metadevices for nonvolatile memory and reconfigurable logic-gate operations Kim, Woo Young; Kim, Hyeon-Don; Kim, Teun-Teun; Park, Hyun-Sung; Lee, Kanghee; Choi, Hyun Joo; Lee, Seung Hoon; et al, NATURE COMMUNICATIONS, v.7, 2016-01 |
Hygroscopic properties of particulate matter and effects of their interactions with weather on visibility Won, Wan-Sik; Oh, Rosy; Lee, Woojoo; Ku, Sungkwan; Su, Pei-Chen; Yoon, Yong-Jin, SCIENTIFIC REPORTS, v.11, no.1, 2021-08 |
Large-area thickness measurement of transparent multi-layer films based on laser confocal reflection sensor Choi, Young-Man; Yoo, Hongki; Kang, Dongwoo, MEASUREMENT, v.153, 2020-03 |
Measurement technologies for precision positioning Gao, W.; Kim, Seung-Woo; Bosse, H.; Haitjema, H.; Chena, Y. L.; Lu, X. D.; Knapp, W.; et al, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.64, no.2, pp.773 - 796, 2015-06 |
Optofluidic particle manipulation in a liquid-core/liquid-cladding waveguide Lee, Kang-Soo; Yoon, Sang-Youl; Lee, Kyung-Heon; Kim, Sang-Bok; Sung, Hyung-Jin; Kim, Sang-Soo, OPTICS EXPRESS, v.20, no.16, pp.17348 - 17358, 2012-07 |
Perspective and potential of smart optical materials Choi, Sang H.; Duzik, Adam J.; Kim, Hyun-Jung; Park, Yeonjoon; Kim, Jaehwan; Ko, Hyun-U; Kim, Hyun-Chan; et al, SMART MATERIALS AND STRUCTURES, v.26, no.9, 2017-09 |
Quantitative Analysis of Monosaccharide Concentration Using Terahertz Time-Domain Spectroscopy in Ambient Atmosphere Lee, Jinwoo; Kim, Soohyun, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.70, 2021 |
Sub-Beam Size Temperature Measurement of Heavily Doped Silicon Heater Using Two-Wavelength Thermoreflectance Microscopy Rho, Jinsung; Lee, Bong Jae, JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, v.139, no.5, pp.052703-1 - 052703-8, 2017-05 |
Three-dimensional confocal reflectance microscopy for surface metrology Kim, Chang-Soo; Yoo, Hongki, MEASUREMENT SCIENCE AND TECHNOLOGY, v.32, no.10, 2021-10 |
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