Browse "ME-Journal Papers(저널논문)" by Subject PROBE
Showing results 1 to 9 of 9
| Advanced temperature compensation for piezoresistive sensors based on crystallographic orientation Chui, B. W.; Aeschimann, L.; Akiyama, T.; Staufer, U.; de Rooij, N. F.; Lee, Jungchul; Goericke, F.; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.4, 2007-04 |
| Characterization of adhesion property between fused silica and thermoplastic polymer film in thermal nanoimprint lithography using a novel pull-off test Kim, Kwang-Seop; Kang, Ji-Hoon; Choi, Dae-Geun; Kim, Kyung-Woong, MICROELECTRONIC ENGINEERING, v.88, no.6, pp.855 - 860, 2011-06 |
| Evaluation of optical reflectance techniques for imaging of alveolar structure Unglert, Carolin I.; Namati, Eman; Warger, William C., II; Liu, Linbo; Yoo, Hongki; Kang, DongKyun; Bouma, Brett E.; et al, JOURNAL OF BIOMEDICAL OPTICS, v.17, no.7, 2012-07 |
| Fabrication of sharp-needled conical polymer tip on the cross-section of optical fiber via two-photon polymerization for tuning-fork-based atomic force microscopy Jung, Byung Je; Kong, Hong Jin; Cho, Yong-Hoon; Lee, Kyu-Seung; Park, Chung-Hyun; Yang, Dong-Yol; Lee, Kwang-Sup, OPTICS COMMUNICATIONS, v.286, pp.197 - 203, 2013-01 |
| Nozzle-based precision patterning with micro-/nano fluidics integrated cantilevers Ko, Juhee; Fredj, Nada; Adhawiyah, Rafita Erli; Lee, Jungchul, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.37, no.2, pp.887 - 900, 2023-02 |
| Orthogonality correction of planar sample scanner for atomic force microscope Lee, DY; Lee, MY; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.45, no.12-16, pp.L370 - L372, 2006-04 |
| Precise rotary motor by inchworm motion using dual wrap belts Kim, SC; Kim, Soohyun, REVIEW OF SCIENTIFIC INSTRUMENTS, v.70, no.5, pp.2546 - 2550, 1999-05 |
| Suspended microchannel resonators with piezoresistive sensors Lee, Jungchul; Chunara, R.; Shen, W.; Payer, K.; Babcock, K.; Burg, T. P.; Manalis, S. R., LAB ON A CHIP, v.11, no.4, pp.645 - 651, 2011 |
| Topography imaging with a heated atomic force microscope cantilever in tapping mode Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P., REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.4, 2007-04 |
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