Browse "ME-Journal Papers(저널논문)" by Subject FRINGE-ORDER

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Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry

You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12

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