Browse "ME-Journal Papers(저널논문)" by Subject DIGITAL HOLOGRAPHY
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| High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12 |
Synthetic Fourier transform light scattering Lee, Kyeo Reh; Kim, Hyeon-Don; Kim, Kyoohyun; Kim, Youngchan; Hillman, Timothy R.; Min, Bumki; Park, YongKeun, OPTICS EXPRESS, v.21, no.19, pp.22453 - 22463, 2013-09 |
| Three-dimensional object recognition using x-ray imaging Yeom, S; Javidi, B; Roh, YJ; Cho, Hyungsuck, OPTICAL ENGINEERING, v.44, no.2, pp.27201 - 27224, 2005-02 |
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