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Azimuthal position error correction algorithm for absolute test of large optical surfaces Rhee, Hyug-Gyo; Lee, Yun-Woo; Kim, Seung-Woo, OPTICS EXPRESS, v.14, no.20, pp.9169 - 9177, 2006-10 |
Metrological atomic force microscopy integrated with a modified two-point diffraction interferometer Jin, Jonghan; Rhee, Hyug-Gyo; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.10, 2009 |
Transferable ultra-thin multi-level micro-optics patterned by tunable photoreduction and photoablation for hybrid optics Lee, Hyub; Low, Mun Ji; Lim, Chin Huat Joel; An, Jianing; Sandeep, C. S. Suchand; Rohith, Thazhe Madam; Rhee, Hyug-Gyo; et al, CARBON, v.149, pp.572 - 581, 2019-08 |
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