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Compensation of phase change on reflection in white-light interferometry for step height measurement Park, MC; Kim, Seung-Woo, OPTICS LETTERS, v.26, no.7, pp.420 - 422, 2001-04 |
Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms Park, MC; Kim, Seung-Woo, OPTICAL ENGINEERING, v.39, no.4, pp.952 - 959, 2000-04 |
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