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3D profiling of rough silicon carbide surfaces by coherence scanning interferometry using a femtosecond laser Lu, Yang; Park, Jiyong; Yu, Liandong; Kim, Seung-Woo, APPLIED OPTICS, v.57, no.10, pp.2584 - 2589, 2018-03 |
Rigorous single pulse imaging for ultrafast interferometric observation![]() Kim, Daehee; Lu, Yang; Park, Jiyong; Kim, Byunggi; Yan, Liping; Yu, Liandong; Joo, Ki-Nam; et al, OPTICS EXPRESS, v.27, no.14, pp.19758 - 19767, 2019-07 |
Simultaneous 3-D Surface Profiling of Multiple Targets by Repetition Rate Scanning of a Single Femtosecond Laser Lu, Yang; Park, Jiyong; Bian, Dian; Yu, Liandong; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.21, no.2, pp.211 - 217, 2020-02 |
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