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A simple and quantitative alignment procedure between solid state cameras Lee, Hyungchul; Kim, Daesuk; Kim, Soohyun, OPTICS EXPRESS, v.17, no.26, pp.23947 - 23952, 2009-12 |
High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12 |
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