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Detection of Graphene Cracks By Electromagnetic Induction, Insensitive to Doping Level Yoon, Taeshik; Kang, Sumin; Kang, Tae Yeob; Kim, Taek-Soo, CMES-COMPUTER MODELING IN ENGINEERING & SCIENCES, v.120, no.2, pp.351 - 361, 2019-08 |
Quantification of Performance Variation and Crack Evolution of Bond-Wire Interconnects Under Harsh Temperature Environments by S-Parameter Analysis Kang, Tae Yeob; Seo, Donghwan; Min, Joonki; Kim, Taek-Soo, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.11, no.6, pp.990 - 998, 2021-06 |
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