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Realization of high sensitivity displacement field from moire interferometer with rough phase shifting mechanism and pattern matching technique Yang, SY; Lee, Soon-Bok, OPTICS AND LASERS IN ENGINEERING, v.43, no.6, pp.721 - 736, 2005-06 |
Solder reflow process induced residual warpage measurement and its influence on reliability of flip-chip electronic packages Yang, SY; Jeon, YD; Lee, Soon-Bok; Paik, Kyung-Wook, MICROELECTRONICS RELIABILITY, v.46, pp.512 - 522, 2006-02 |
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