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Results 1-10 of 388 (Search time: 0.006 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
3-dimensional measurement of surface profiles by slit beam scanning topography

Kim, Seung-Woo; Park Hyun-Goo, Proceedings of the 1992 Japan - USA Symposium on Flexible Automation Part 2 (of 2), pp.1083 - 1087, 1992-07-13

2
Adaptive Control of the Cylindrical Grinding Process

Kim, Seung-Woo; Shumsheruddin, A.A., Winter Annual Meeting of the ASME, pp.373 - 387, 1985

3
3-Dimensional Measurement of Surface Profile by Moire Topography

Park, H.G.; Kim, Seung-Woo, Proc. of CIRP Conf. on Precision Engineering and Manufacturing Systems, pp.163 - 172, 1991-11

4
Optimal Design Methodology of Servo Systems for Point-To-Point Control

Kim, Seung-Woo, Proc. of the Int'l Conf. on Advanced Mechatronics, pp.59 - 65, 1991-10-08

5
Direct Measurement of Spindle Radial Accuracy by Moire Topography

Kim, Seung-Woo, Proc. of the 7th International Precision Engineering Seminar, pp.441 - 450, 1993-05

6
On-Line Measurement of Surface Roughness by Light Scattering

Kim, Seung-Woo, 1990 Japan-U.S.A. Symposium on Flexible Automation, ISCIE, pp.703 - 706, 1990

7
Active Compensation of Movement Errors of a Machine Axis by Multiple Null-Balancing using Twyman-Green Interferometry

Kim, Seung-Woo; Lee ,H.S., Proc. of the 3rd international Workshop on Advanced Motion Control, pp.689 - 698, 1994

8
Multi-Axis Dual-Servo Control of an XYQ- Stage for Ultraprecision Positioning Over Long Travel

Kim, Seung-Woo; Lee, C.W.; Oh, J.K.; Lee, H.S., Proceedings of International Federation of Automatic Control, pp.347 - 353, 1995

9
compensation for phasw change on reflection in white-light scanning interferometry

Park, M,C,; Kang, M.G.; Kim, Seung-Woo, SPIE, pp.128 - 135, 2002

10
Active thermal stabilization of machine structure using the fixed temperature point of gallium

Kim, Seung-Woo, Proc. of 2nd Euspen International Conference, pp.824 - 827, 2001-05-27

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