Browse "ME-Conference Papers(학술회의논문)" by Author Woo H.G.

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1
Inspection system for microelectronics BGA package using wavelength scanning interferometry

Kang C.M.; Woo H.G.; Cho, Hyungsuck; Hahn J.W.; Lee J.Y., Optomechatronic Systems II, pp.74 - 85, International Society for Optical Engineering (SPIE), 2001-10-29

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