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TTA-COPE: Test-Time Adaptation for Category-Level Object Pose Estimation

Lee, Taeyeop; Tremblay Jonathan; Blukis, Valts; Wen Bowen; Lee, ByeongUk; Shin, Inkyu; Birchfield Stan; et al, IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2023), IEEE/CVF, 2023-06-21

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