Browse "ME-Conference Papers(학술회의논문)" by Author Se Baek Oh

Showing results 1 to 2 of 2

1
Novel cross-correlation algorithm for reducing noise-related errors in array type Optical triangulation displacement sensors

Kim K.-C.; Se Baek Oh; Kim, Soohyun; Kwak, Yoon Keun, Testing, Reliability, and Applications of Optoelectronic Devices, pp.95 - 101, SPIE, 2001-01-24

2
Resolution enhancement using a diffraction grating for optical triangulation displacement sensor

Se Baek Oh; Kim K.-C.; Kim, Soohyun; Kwak, Yoon Keun, Testing, Reliability, and Applications of Optoelectronic Devices, pp.102 - 108, SPIE, 2001-01-24

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