Browse "ME-Conference Papers(학술회의논문)" by Author Roh Y.J.

Showing results 1 to 8 of 8

1
6 DOF pose estimation of polyhedral objects based on analysis of geometric features in x-ray images

Kim J.W.; Roh Y.J.; Cho, Hyungsuck, Optomechatronic Systems II, pp.23 - 34, International Society for Optical Engineering (SPIE), 2001-10-29

2
A visual inspection system with flexible illumination and auto-focusing

Roh Y.J.; Lee D.Y.; Kim M.Y.; Cho, Hyungsuck, Optomechatronic Systems III, pp.463 - 475, International Society for Optical Engineering (SPIE), 2002-11-12

3
An implementation of uniform and simultaneous ART for 3D volume reconstruction in X-ray imaging system

Roh Y.J.; Park W.S.; Cho, Hyungsuck; Jeon H.J., Optomechatronic Systems III, pp.576 - 587, International Society for Optical Engineering (SPIE), 2002-11-12

4
Design and analysis of x-ray digital tomosynthesis system

Roh Y.J.; Cho, Hyungsuck, 40th SICE Annual Conference, pp.252 - 258, SICE, 2001-07-25

5
Image reconstruction in x-ray tomography using a radial basis function(RBF) neural network

Roh Y.J.; Cho, Hyungsuck, Optomechatronic Systems II, pp.35 - 46, International Society for Optical Engineering (SPIE), 2001-10-29

6
Inspection of ball grid array (BGA) solder joints using X-ray cross-sectional images

Roh Y.J.; Ko K.W.; Cho, Hyungsuck; Kim H.C.; Joo H.N.; Kim S.K., Proceedings of the 1999 Machine Vision Systems for Inspection and Metrology VIII, v.3836, pp.168 - 178, International Society for Optical Engineering (SPIE), 1999-09-21

7
Opto-mechatronic systems technology: Fundamentals, state of the arts and future directions

Cho, Hyungsuck; Roh Y.J., Algorithms and Systems for Optical Information Processing VI, pp.85 - 98, International Society for Optical Engineering (SPIE), 2002-07-09

8
The calibration of x-ray digital tomosynthesis system including the compensation of the image distortion

Roh Y.J.; Koh K.W.; Cho, Hyungsuck; Kim J.Y.; Kim H.C.; Byun J.-E., Machine Vision Systems for Inspection and Metrology VII, pp.248 - 259, International Society for Optical Engineering (SPIE), 1998-11-04

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