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A new design and kinematic analysis of 3-axis motion stage for ellipsometer Jeong, J-H; Park, S-L; Seo, J-W; Gweon, Dae-Gab, Int. Conf. on Mechatronic Technology, pp.327 - 329, 1999-10 |
Improved Phase Unwrapping of Phase Shift Interferometer using Precision XY-Scanner Park, S-L; Moon, K-S; Gweon, Dae-Gab, SPIE Conf. on Optical Engineering for Sensing and Nanotechnology, pp.12 - 15, SPIE, 1999-06 |
The Calibration of tilting and reflective index of specimen in confocal scanning microscopy Seo, J-W; Park, S-L; Oh, H-Y; Lee, J-H; Gweon, Dae-Gab, Annual Meeting of American Society for Precision Engineering, pp.279 - 281, 1999-06 |
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