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A point-diffraction interferometer with vibration-desensitizing capability Kihm H.; Park J.; Kwon T.; You J.H.; Kim, Seung-Woo, Interferometry XIII: Applications, 123, 2007-08-16 |
Surface metrology of silicon wafers using a femtosecond pulse laser Kwon T.; Joo K.-N.; Kim, Seung-Woo, Interferometry XIV: Techniques and Analysis, 2008-08-11 |
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