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High resolution imaging based transient analysis for self-assembled silicon and germanium membrane and cavity structure Kim, Tae Yeong; Jeong, Jaewoo; Jeong, Mungoung; Lee, Bong Jae; Lee, Jungchul, The 17th International Workshops on Nanomechanical Sensing, NMC 2021, NMC, 2021-06-18 |
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