Browse "ME-Conference Papers(학술회의논문)" by Author J.H., Shim Jr

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A new probing system ibr the in-circuit test of a PCB

J.H., Shim Jr; Cho, Hyungsuck; S., Kim Jr, botics and Automation, 1996. Proceedings., 1996 IEEE International Conference on, pp.590 - 595, IEEE, 1996-04

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