Browse "ME-Conference Papers(학술회의논문)" by Author Anh, Nguyen Duy

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Multi-scale dimensional metrology with a frequency comb: From sub-nanometers to kilometers

Kim, Young-Jin; Anh, Nguyen Duy; Kim, Seung-Woo, LS 2020 - Part of Frontiers in Optics + Laser Science APS/DLS 2020, The Optical Society, 2020-09

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