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Multi-physics analysis for assembling of nano particle under the mixture condition of the dielectric fluid and AC electric field Kwon S.-G.; Kim, Soohyun; Yoo Y.-E.; Lee E.-S.; Han C.-S., 2004 4th IEEE Conference on Nanotechnology, pp.547 - 549, IEEE, 2004-08-16 |
UV-nanoimprint lithography using a diamond-like carbon stamp Jeong J.-H.; Kim K.-D.; Sim Y.-S.; Choi D.-G.; Lee E.-S.; Park S.-H.; Lim T.-W.; et al, SPIE(the international society for optical engineering), 31th international symposium, v.6151 II, pp.19 - 24, 2006-01-21 |
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