Browse "ME-Conference Papers(학술회의논문)" by Author Kim, YJ

Showing results 6 to 9 of 9

6
High precision surface-profile metrology by scanning the repetition rate of femtosecond pulses

Joo, WD; Kim, YJ; Kim,YS; Park, JY; Kim, Seung-Woo, SPIE 2011 Optics+Photonics, SPIE 2011 Optics+Photonics, 2011-08-21

7
High-resolution time-of-flight measurement using a femtosecond pulse laser

Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29

8
High-resolution time-of-flight measurement using a femtosecond pulse laser

Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, The 4th International Conference on Positioning Technology (ICPT), The 4th International Conference on Positioning Technology, 2010-11

9
Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers

Jin, J; Kim, YJ; Kim, Seung-Woo, nanoengineering symposium 2005, pp.192 - 197, 2005-10-26

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