Showing results 6 to 9 of 9
High precision surface-profile metrology by scanning the repetition rate of femtosecond pulses Joo, WD; Kim, YJ; Kim,YS; Park, JY; Kim, Seung-Woo, SPIE 2011 Optics+Photonics, SPIE 2011 Optics+Photonics, 2011-08-21 |
High-resolution time-of-flight measurement using a femtosecond pulse laser Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
High-resolution time-of-flight measurement using a femtosecond pulse laser Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, The 4th International Conference on Positioning Technology (ICPT), The 4th International Conference on Positioning Technology, 2010-11 |
Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers Jin, J; Kim, YJ; Kim, Seung-Woo, nanoengineering symposium 2005, pp.192 - 197, 2005-10-26 |
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