Showing results 1 to 1 of 1
Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection Yoon, Changhyeong; Kang, Munkyu; Hong, Jin Hee; Yang, Taeseok; Xing, Jing Chao; Yoo, Hongki; Choi, Youngwoon; et al, SPIE Photonics West 2018, SPIE, 2018-01-29 |
Discover