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Comparison Study between Probabilistic and Possibilistic Approach for Problems with Correlated Input and Lack of Input Statistical Information Lee, IkJin; Choi, Kyung K; Noh, Yoojeong, ASME IDETC/DAC, ASME, 2009-08-31 |
Comparison Study between Probabilistic and Possibilistic Approach for Problems with Correlated Input and Lack of Input Statistical Information Lee, IkJin; Choi, Kyung K; Noh, Yoojeong, WCSMO8 Conference, WCSMO8, 2009-06-02 |
Sampling-Based Stochastic Sensitivity Analysis Using Score functions for RBDO problems with Correlated Random Variables Lee, IkJin; Choi, Kyung K; Noh, Yoojeong; Liang, Zhao; David, Gorsich, ASME IDETC/DAC, ASME, 2010-08-16 |
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