Showing results 1 to 2 of 2
Development of Integrated and Intelligent Design and Analysis System for Forging Processes Yang, Dong-Yol; Im,Y. T.; Yoo,Y.C.; Park, J.J.; Kim, J.H., CIRP 2000, CIRP 2000, 2000-08 |
On-machine surface profile metrology for large-scale optics Kim, Seung-Woo; Park, J.J.; Kwon, T.M.; You, J.H.; Kihm, H.Y., ASPEN 2007, 2007 |
Discover