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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
Investigating carrier localization and transfer in InGaN/GaN quantum wells with V-pits using near-field scanning optical microscopy and correlation analysis Kim, Min Kwan; Choi, Sunghan; Lee, Joo-Hyung; Park, Chunghyun; Chung, Tae-Hoon; Baek, Jong Hyeob; Cho, Yong-Hoon, SCIENTIFIC REPORTS, v.7, pp.42221, 2017-02 |