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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Comparative study on the crack formations in the CeO2 buffer layers for YBCO films on textured Ni tapes and Pt tapes Oh, S.; Yoo, J.; Lee, K.; Kim, J.; Youm, Do-Jun, PHYSICA C, v.308, no.1-2, pp.91 - 98, 1998-11 |