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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Electrically deactivating nearest-neighbor donor-pair defects in Si Kim, YS; Lee, EC; Chang, Kee-Joo, PHYSICAL REVIEW LETTERS, v.91, pp.125503 - 125503, 2003-09 | |
| H-related defect complexes in HfO2: A model for positive fixed charge defects Kang, J; Lee, EC; Chang, Kee-Joo; Jin, YG, APPLIED PHYSICS LETTERS, v.84, pp.3894 - 3896, 2004-05 | |
| Stability of wurtzite and rocksalt MgxZn1-xO alloys Kim, YS; Lee, EC; Chang, Kee-Joo, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, pp.92 - 96, 2001-12 | |
| Atomic model for the electrical deactivation of N in Si oxynitrides Lee, EC; Chang, Kee-Joo, PHYSICA B-CONDENSED MATTER, v.340, pp.974 - 977, 2003-12 | |
| Mechanism for oxidative etching in carbon nanotubes Moon, CY; Kim, YS; Lee, EC; Jin, YG; Chang, Kee-Joo, PHYSICAL REVIEW B, v.65, no.15, pp.155401 - 155401, 2002-04 |
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