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Investigating carrier localization and transfer in InGaN/GaN quantum wells with V-pits using near-field scanning optical microscopy and correlation analysis Kim, Min Kwan; Choi, Sunghan; Lee, Joo-Hyung; Park, Chunghyun; Chung, Tae-Hoon; Baek, Jong Hyeob; Cho, Yong-Hoon, SCIENTIFIC REPORTS, v.7, pp.42221, 2017-02 |
Investigation of Strained Multi-Quantum Well Structures for High Bright AlGaInP-Based Light Emitting Diodes Oh, Hwa Sub; Joo, Jee Hue; Lee, Jin Hong; Baek, Jong Hyeob; Lee, June Key; Lee, Sun Kyun; Cho, YH; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.48, 2009-07 |
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