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Investigating carrier localization and transfer in InGaN/GaN quantum wells with V-pits using near-field scanning optical microscopy and correlation analysis

Kim, Min Kwan; Choi, Sunghan; Lee, Joo-Hyung; Park, Chunghyun; Chung, Tae-Hoon; Baek, Jong Hyeob; Cho, Yong-Hoon, SCIENTIFIC REPORTS, v.7, pp.42221, 2017-02

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