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Radiation effect test for single-crystalline and polycrystalline silicon solar cells Shin, Goo-Hwan; Ryu, Kwang-Sun; Kim, Hyung-Myung; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, pp.843 - 847, 2008-03 |
Simulation and ground test for the total ionizing dose effects of STSAT-2 Ryu, Kwangsun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Sungjoon; Ko, Dai-Ho; Kim, Heejun; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, no.5, pp.1552 - 1556, 2007-05 |
Single event upset measurements of memory chips for the Langmuir probe on STSAT-2 Ryu, Kwangsun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Heejoon; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, pp.853 - 857, 2008-03 |
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