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Nonlinear optical study of palladium Schiff base complex using femtosecond differential optical Kerr gate and Z-scan techniques Rudresha, Bada Jayappa; Bhat, Badekai Ramachandra; Ramakrishna, Dileep; Anthony, John Kiran; Lee, H. W.; Rotermund, Fabian Marcel, OPTICS AND LASER TECHNOLOGY, v.44, no.4, pp.1180 - 1183, 2012-06 |
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