Showing results 1 to 1 of 1
Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05 |
Discover