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Scanning Hall probe measurements of field distributions of a coated conductor under applied fields Yoo, J; Jung, YW; Lee, J; Lim, S; Lee, S; Jung, YH; Youm, Do-Jun; et al, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.19, pp.1291 - 1296, 2006-12 |
Versatile low-temperature atomic force microscope with in situ piezomotor controls, charge-coupled device vision, and tip-gated transport measurement capability Lee, Jhinhwan; Chae, J; Kim, CK; Kim, CK; Oh, S, REVIEW OF SCIENTIFIC INSTRUMENTS, v.76, pp.616 - 623, 2005-09 |
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