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The effect of Al segregation on Schottky barrier height and effective work function in TiAl/TiN/HfO2 gate stacks Kim, Geun Myeong; Oh, Young Jun; Chang, Kee Joo, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.27, pp.275104 - 275104, 2016-07 |
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