An Analysis of Current Saturation Mechanism of Junction Field-Effect Transistors

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dc.contributor.authorKim, Choong Kiko
dc.contributor.authorE.S.Yangko
dc.date.accessioned2013-02-25T12:34:52Z-
dc.date.available2013-02-25T12:34:52Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1970-02-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.17, no.2, pp.120 - 127-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10203/62219-
dc.languageEnglish-
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc-
dc.titleAn Analysis of Current Saturation Mechanism of Junction Field-Effect Transistors-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume17-
dc.citation.issue2-
dc.citation.beginningpage120-
dc.citation.endingpage127-
dc.citation.publicationnameIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.contributor.nonIdAuthorE.S.Yang-
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