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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Single-shot full-field nano-scale topography measurement using spectrally multiplexed Kramers–Kronig holographic imaging Lee, ChungHa; Park, Yong Keun; Baek, Yoonseok; Hugonnet, Herve Jerome, NANO KOREA 2022 Symposium, Ministry of Science and ICT, 2022-07-08 | |
Single-shot measurement of surface topography exploiting spectral multiplexed Kramers-Kronig holographic imaging Lee, ChungHa; Park, Yong Keun; Baek, Yoonseok; Hugonnet, Herve Jerome, SPIE Photonics West 2022, SPIE - International Society for Optics and Photonics, 2022-02-21 |
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