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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Migration Pathways and Barriers for B Diffusion at Defected Si/⍺-quartz SiO2 Interface Kim, Geun-Myeong; Oh, Young Jun; Chang, Kee-Joo, 16th Asian Workshop on First-Principles Electronic Structure Calculations, CSRC, 2013-10 | |
| Ge chemical bonding effect on B diffusion in SiGe/SiO2 interface Lee, Chang Hwi; Oh, Young Jun; Kim, Geun-Myeong; Chang, Kee-Joo, 16th Asian Workshop on First-Principles Electronic Structure Calculations, CSRC, 2013-10 |
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