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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Migration pathway and barrier for B diffusion at the planar interface between Si and SiO2 Kim, Geun-Myung; Oh, Young Jun; Chang, Kee-Joo, The 15th Asian Workshop on First-Principles Electronic Structure Calculations, National Taiwan University, 2012-11 | |
| Mechanisms for boron diffusion and segregation at the Si/SiO2 interface Oh, Young Jun; Kim, Geun-Myung; Noh, Hyeon-Kyun; Chang, Kee-Joo, 31st International Conference on the Physics of Semiconductors, ICPS, 2012-07 |
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