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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Role of Oxygen-Related Defects in the Instability of Amorphous In-Ga-Zn-O Thin FlimTransistor Oh, Young-Jun; HAN, WOOHYUN; Noh, Hyeon-Kyun; Chang, Kee-Joo, 32nd International Conference on the Physics of Semiconductors, ICPS, 2014-08 |