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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Migration Pathways and Barrier for B diffusion in SiO2 and SiGe/SiO2 interfaces Chang, Kee-Joo; Oh, Young-Jun; Lee, Chang Hwi, The 17th International Symposium Physics of semiconductors and Applications, ISPSA, 2014-12-10 |
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