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Current issues and first-principles calculations in Si-based nanotechnology Kim, DY; Kang, J; Chang, Kee-Joo, 10th SANKEN International Symposium on Nanoscience and Nanotechnology, 2006-09 |
The impact of Si impurities in HfO2 Kim, DY; Kang, J; Chang, Kee-Joo, The International Conference on Advanced Materials and Devices, ICAMD, 2005-12 |
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