Browse "PH-Conference Papers(학술회의논문)" by Author Jhe, W

Showing results 1 to 10 of 10

1
Critical issues of localization in the development of InGaN/GaN laser diodes

Bidnyk, S; Cho, Yong-Hoon; Schmidt, TJ; Gainer, GH; Song, JJ; Keller, S; Denbaars, SP; et al, pp.286 -, 1999

2
Dynamics of anomalous temperature-induced emission shift in MOCVD-grown (Al, In)GaN thin films

Cho, Yong-Hoon; Gainer, GH; Lam, J; Song, JJ; Yang, W; Jhe, W, Mat. Res. Soc. Symp. Proc, 2000

3
Effects of carrier localization on the optical characteristics of MOCVD-grown InGaN/GaN heterostructrues

Cho, Yong-Hoon; Schmidt, TJ; Bidnyk, S; Gainer, GH; Song, JJ; Keller, S; Denbaars, SP; et al, The 3rd International Conference on Nitride Semiconductors (ICNS-3), 1999

4
High-efficiency luminescence up-conversion of infrared to red light in type-I and type-II AlxGa1-xAs/InGaP single heterostructures

Cho, Yong-Hoon; Lim, H; Jhe, W, pp.955 -, 1999

5
Low temperature near-field scanning optical spectroscopy of semiconductor nanostructures

Eah, SK; Hhong, SC; Park, JH; Cho, Yong-Hoon; Kim, DS; Jhe, W, , 1999

6
Near-field photoreflectance spectroscopic studies of semiconductor quantum well structures

Cho, Yong-Hoon; Jhe, W, Conference on Laser and Electro-Optics (CLEO)/Pacific Rim 2001, 2001-07-15

7
Optical characteristics of AlGaN, GaN, and InGaN thin films: a comparison and temperature dependence

Cho, Yong-Hoon; Schmidt, TJ; Gainer, GH; Lam, JB; Song, JJ; Keller, S; Denbaars, SP; et al, The 3rd International Conference on Nitride Semiconductors (ICNS-3), pp.77 -, 1999

8
Optical Characteristics of Group III-Nitride Quantum Structures

Cho, Yong-Hoon; Jhe, W; Schmidt, TJ; Bidnyk, S; Gainer, GH; Song, JJ, Proceedings of the 3rd Korea-China Joint Workshop on Advanced Materials, pp.351 -, 1999

9
Optical emission characteristics of GaAs and GaN structures using low temperature near-field scanning optical spectroscopy

Cho, Yong-Hoon; Eah, SK; Hohng, SC; Kim, DS; Yang, GM; Song, JJ; Jhe, W, Pacific Rim’99, Technical Digest, pp.999 -, 1999

10
Photoreflectance spectroscopy and imaging of quantum structures using near-field scanning optical microscope

Cho, Yong-Hoon; Eah, SK; Hohng, SC; Kim, DS; Jhe, W, pp.99 -, 1999

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