Showing results 1 to 3 of 3
A finite-size supercell correction scheme for charged defects in one-dimensional systems: Application to impurities in silicon nanowires Kim, Sung-Hyun; Park, Ji-Sang; Chang, Kee-Joo, 2014 APS March Meeting, APS, 2014-03 |
Determination of Accurate Transistion Levels of Charged Defects in Silicon Nanowire Kim, Sung-Hyun; Park, Ji-Sang; Chang, Kee-Joo, 32nd International Conference on the Physics of Semiconductors, ICPS, 2014-08 |
Finite-zsize supercell correction scheme for the formation energy of charged defects in silicon nanowires Kim, Sung-Hyun; Park, Ji-Sang; Chang, Kee-Joo, The 17th Asian Workshop on First-Principles Electronic Structure Calculations, KIAS, 2014-11-05 |
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