Showing results 4 to 6 of 6
Spontaneous emission factor of oxidized VCSELs from the measured below-threshold cavity loss Shin, JH; Kim, JH; Ju, YG; Shin, HE; Lee, Yong-Hee, CLEO '97, CLEO, 1997 |
Strong polarization selectivity in 780-nm vertical-cavity surface-emitting lasers grown on misoriented substrates Ju, YG; Lee, Yong-Hee; Shin, HK; Kim, I, Proceedings of the 1997 10th IEEE Lasers and Electro-Optics Society Annual Meeting, LEOS. Part 2 (of 2), v.2, pp.291 - 292, IEEE, 1997-11-10 |
Ultralow threshold current 780-nm vertical-cavity surface-emitting lasers with oxide current aperture Shin, HY; Ju, YG; Lee, Yong-Hee, CLEO 96, pp.0 - 0, CLEO, 1996-06-01 |
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