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Issues and first-principles calculations in Si-based nanoscale devices Chang, Kee-Joo; Kang, J.; Choi, E.-A.; Kim, Y.-H., The 4th Conference of the Asian Consortium on Computational Materials Science , ACCMS-4, 2007-09 |
Role of defects on direct electron tunneling through ultra-thin SiO_2 Chang, Kee-Joo; Kang, J.; Bang, J.; Kim, Y.-H., The 24th International Conference on Defects in Semiconductors, 2007-05 |
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