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Improved efficiency of materials processing by dual action of XUV/Vis-NIR ultrashort laser pulses and comprehensive study of high-order harmonic source at PALS Jakubczak, K; Mocek, T; Rus, B; Hrebicek, J; Sawicka, M; Kim, IJ; Park, SB; et al, Advances in X-Ray/EUV Optics and Components IV, v.7448, 2009-08-03 |
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