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Ge chemical bonding effect on B diffusion in SiGe/SiO2 interface Lee, Chang Hwi; Oh, Young Jun; Kim, Geun-Myeong; Chang, Kee-Joo, 16th Asian Workshop on First-Principles Electronic Structure Calculations, CSRC, 2013-10 |
Migration Pathways and Barrier for B diffusion in SiO2 and SiGe/SiO2 interfaces Chang, Kee-Joo; Oh, Young-Jun; Lee, Chang Hwi, The 17th International Symposium Physics of semiconductors and Applications, ISPSA, 2014-12-10 |
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