Browse "MA-Journal Papers(저널논문)" by Author Han, Songhee

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Defect inspection in semiconductor images using FAST-MCD method and neural network

Yu, Jinkyu; Han, Songhee; Lee, Chang-Ock, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.129, no.3-4, pp.1547 - 1565, 2023-11

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